Standard Delivery Specification For LCD Panels
Quality level
1.1
Inspection conditions
1.1.1The environmental conditions for inspection shall be as follows
Room temperature: 22¡À5¡æ
Humidity : 65¡À20%RH
1.1.2 The external visual inspection
The inspection shall be performed by using a single 20W fluorescent
lamp for illumination and the distance from LCD to eyes of the inspector
should be 30¡À5cm.
1.1.3
Light method

1.1.4 Inspection
distance and angle
Inspection should be performed within
¦µ(¦µ is usually 30¡ã) from Z axis to each X and Y axis.
Inspection distance of any direction within ¦µ must be kept 30¡À5cm
to the display surface.
1.2 Sampling procedures
for each item's acceptance level table
| Defect type | Sampling procedures | AQL |
| Major defect | GB2828-87 single sampling plans for normal inspection. | 0.65 |
| Minor defect | GB2828-87 single sampling plans for normal inspection. | 1.5 |
1.3 Classification
of defects
1.3.1 Major defect
A major defect refers to a defect that is considered to substantially
degrade usability for product applications.
1.3.2 Minor defect
A minor defect refers to a defect that is not considered to substantially
degrade product application, or a defect that deviates from existing
standards almost unrelated to the effective use of the product or
its operation.
1.3.3 Defect application zone
1.4
Inspection standards
| ITEM | Criterion for defects | Classification of defects | ||||||||||||||||||||||||||
| (1)Open segment and open common | Any segment or common patterns that does not activate when they should are rejected. | Major | ||||||||||||||||||||||||||
| (2)Short | . No shorts are
allowed. . Segment-to-segment shorts are when two or more segment electrodes are bridged together; they cause the shorted segment to activate together when they should not. (They may not be as dark as other segments) . Segment-to-common shorts are caused by some conductive foreign materials in the fluid bridging between a segment and back plane electrodes. |
Major | ||||||||||||||||||||||||||
| (3)High current | The total current required to activate all segments shall not exceed the limit specified in the specification for approval for the tested voltage. | Major | ||||||||||||||||||||||||||
| (4)Weak segment(Dim segment) | Segments that only partially activate are rejected; they are not as dark as other segments. | Major | ||||||||||||||||||||||||||
| (5)Display Pattern | ¢ÅDot type![]() |
Minor | ||||||||||||||||||||||||||
| Unit: mm (A+B)/2¡Ü0.25 C¡Ý0 (D+E)/2¡Ü0.25 (F+G)/2¡Ü0.25 Note: 1) Acceptable up to 3 damages. 2) If there're two or more pinholes per digit, it is rejected. |
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2) Segment type:![]() |
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| Unit: mm c¡Üw/4 d¡Üw/4 Note: 1) Acceptable up to 3 damages. 2) If there're two or more pinholes per digit, it is rejected. |
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(6)Blemishes or Foreign MattersSize:
D=(A+B)/2 |
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| (7)Dark lines and scratches |
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Minor | ||||||||||||||||||||||||||
| (8)Air bubble in polarizer |
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Minor | ||||||||||||||||||||||||||
| (9)Dirt | Products pass if the dirt can be wiped off easily | |||||||||||||||||||||||||||
| (10)Chip in corner | ![]() |
Minor | ||||||||||||||||||||||||||
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| (11)Chip in seal area | ![]() |
Minor | ||||||||||||||||||||||||||
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| Chip is rejected, if c is greater than 50% of the glass thickness or the seal area is damaged. | ||||||||||||||||||||||||||||
| (12)Chip in pad(1) | ![]() |
Minor | ||||||||||||||||||||||||||
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| (13)Chip in pad(2) | ![]() |
Minor | ||||||||||||||||||||||||||
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| (14)Chip in other sides | ![]() |
Minor | ||||||||||||||||||||||||||
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| (15)Glass rest | ![]() |
Minor | ||||||||||||||||||||||||||
| a¡Ü1/4W | ||||||||||||||||||||||||||||
Reliability
2.1 Items of reliability
All test result items should be judged after 4 hours
recovery time at room temperature and under the state of not
operating.
| ITEM | Condition | Criterion |
| (1)High temperature operating |
Total current
consumption should be below double of initial value. Cosmetic
defects should not be happened.
|
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| (2)Low temperature operating | ||
| (3)Humidity (without polarizer) |
60¡À2¡æ 95¡À5%RH 96hours | |
| (4)High temperature storage | 60¡æ 96hours | |
| (5)Low temperature storage | -10¡æ 24hours | |
| (6)Thermal shock storage | -20¡æ¡ú25¡æ¡ú70¡æ 30min 5min 30min 5cycle | |
| (7)Vibration | 50Hz amplitude :0.7mm 30min for each direction (X.Y.Z) |
Note: No cosmetic
failure means there must be no permanent cosmetic defect and does
not include any recoverable defect after 24 hours or more.








