Standard Delivery Specification For LCD Panels

Quality level

1.1 Inspection conditions

1.1.1The environmental conditions for inspection shall be as follows
Room temperature: 22¡À5¡æ
Humidity : 65¡À20%RH

1.1.2 The external visual inspection
The inspection shall be performed by using a single 20W fluorescent lamp for illumination and the distance from LCD to eyes of the inspector should be 30¡À5cm.

1.1.3 Light method



1.1.4 Inspection distance and angle



Inspection should be performed within ¦µ(¦µ is usually 30¡ã) from Z axis to each X and Y axis.
Inspection distance of any direction within ¦µ must be kept 30¡À5cm to the display surface.


1.2 Sampling procedures for each item's acceptance level table

Defect type Sampling procedures AQL
Major defect GB2828-87 single sampling plans for normal inspection. 0.65
Minor defect GB2828-87 single sampling plans for normal inspection. 1.5


1.3 Classification of defects

1.3.1 Major defect
A major defect refers to a defect that is considered to substantially degrade usability for product applications.

1.3.2 Minor defect
A minor defect refers to a defect that is not considered to substantially degrade product application, or a defect that deviates from existing standards almost unrelated to the effective use of the product or its operation.

1.3.3 Defect application zone




1.4 Inspection standards


ITEM Criterion for defects Classification of defects
(1)Open segment and open common Any segment or common patterns that does not activate when they should are rejected. Major
(2)Short . No shorts are allowed.
. Segment-to-segment shorts are when two or more segment electrodes are bridged together; they cause the shorted segment to activate together when they should not. (They may not be as dark as other segments)
. Segment-to-common shorts are caused by some conductive foreign materials in the fluid bridging between a segment and back plane electrodes.
Major
(3)High current The total current required to activate all segments shall not exceed the limit specified in the specification for approval for the tested voltage. Major
(4)Weak segment(Dim segment) Segments that only partially activate are rejected; they are not as dark as other segments. Major
(5)Display Pattern ¢ÅDot type
Minor
Unit: mm
(A+B)/2¡Ü0.25 C¡Ý0
(D+E)/2¡Ü0.25 (F+G)/2¡Ü0.25
Note:
1) Acceptable up to 3 damages.
2) If there're two or more pinholes per digit, it is rejected.
2) Segment type:
Unit: mm
c¡Üw/4 d¡Üw/4
Note:
1) Acceptable up to 3 damages.
2) If there're two or more pinholes per digit, it is rejected.
Size D (mm) Acceptable number
D=(a+b)/2 A zone
D©‚0.15 Ignore
0.15¡ÜD©‚0.25 2
0.18©‚D©‚0.25 1
0.25¡ÜD 0
(6)Blemishes or Foreign MattersSize: D=(A+B)/2
Size D (mm) Acceptable number
A zone B zone
D¡Ü0.15 Ignore Ignore
0.15©‚D¡Ü0.20 2 Ignore
0.2©‚D¡Ü0.25 1 -
0.2©‚D¡Ü0.3 - 2
0.25©‚D¡Ü0.3 0 1
0.5©‚D 0 0
 
(7)Dark lines and scratches
Width (mm) Length(mm) Acceptable number
A zone B zone
W¡Ü0.03 L¡Ü3.0 3 Ignore
0.03<W¡Ü0.05 L¡Ü2.0 2 3
0.05<W¡Ü0.08 L¡Ü2.0 1 2
0.08<W¡Ü0.1 L¡Ü3.0 0 1
0.1<W L>3.0 0 0
Minor
(8)Air bubble in polarizer
Size D (mm) Acceptable number
A zone B zone
D¡Ü0.20 Ignore Ignore
0.20©‚D¡Ü0.40 3 Ignore
0.40©‚D¡Ü0.60 2 Ignore
0.2©‚D¡Ü0.3 0 0
Minor
(9)Dirt Products pass if the dirt can be wiped off easily
(10)Chip in corner Minor
a b c Acceptable number
a©‚4mm b¡ÜW C¡ÜT 3
(11)Chip in seal area Minor
a b c Acceptable number
a©‚3mm b¡Ü1.5mm c¡Ü1/2T 3
Chip is rejected, if c is greater than 50% of the glass thickness or the seal area is damaged.
(12)Chip in pad(1) Minor
a b c Acceptable number
a¡Ü2mm b¡ÜW/4 c¡ÜT ignore
a¡Ü3mm b¡ÜW/4 c¡ÜT 3
(13)Chip in pad(2) Minor
a b c Acceptable number
a¡Ü2mm b¡ÜW/3 c¡ÜT ignore
a¡Ü4mm b¡ÜW/2 c¡ÜT 3
(14)Chip in other sides Minor
a b c Acceptable number
a¡Ü3mm b¡Ü1mm c¡ÜT ignore
a¡Ü4mm b¡Ü1.5mm c¡ÜT 3
(15)Glass rest Minor
a¡Ü1/4W

Reliability

2.1 Items of reliability
All test result items should be judged after 4 hours recovery time at room temperature and under the state of not operating.

ITEM Condition Criterion
(1)High temperature operating  
Total current consumption should be below double of initial value. Cosmetic defects should not be happened. 
(2)Low temperature operating  
(3)Humidity
(without polarizer)
60¡À2¡æ   95¡À5%RH  96hours
(4)High temperature storage 60¡æ  96hours
(5)Low temperature storage -10¡æ  24hours
(6)Thermal shock storage  -20¡æ¡ú25¡æ¡ú70¡æ 30min  5min  30min 5cycle
(7)Vibration 50Hz amplitude :0.7mm 30min for each direction (X.Y.Z)

Note: No cosmetic failure means there must be no permanent cosmetic defect and does not include any recoverable defect after 24 hours or more.