Tech Support- Standard Delivery Specification
For LCD Panels

Quality level

1.1 Inspection conditions

1.1.1The environmental conditions for inspection shall be as follows
Room temperature: 22±5℃
Humidity : 65±20%RH

1.1.2 The external visual inspection
The inspection shall be performed by using a single 20W fluorescent lamp for illumination and the distance from LCD to eyes of the inspector should be 30±5cm.

1.1.3 Light method



1.1.4 Inspection distance and angle



Inspection should be performed within Φ(Φ is usually 30°) from Z axis to each X and Y axis.
Inspection distance of any direction within Φ must be kept 30±5cm to the display surface.

1.2 Sampling procedures for each item's acceptance level table

Defect type	Sampling procedures	AQL
Major defect	GB2828-87 single sampling plans for normal inspection.	0.65
Minor defect	GB2828-87 single sampling plans for normal inspection.	1.5

1.3 Classification of defects

1.3.1 Major defect
A major defect refers to a defect that is considered to substantially degrade usability for product applications.

1.3.2 Minor defect
A minor defect refers to a defect that is not considered to substantially degrade product application, or a defect that deviates from existing standards almost unrelated to the effective use of the product or its operation.

1.3.3 Defect application zone

1.4 Inspection standards

ITEM	Criterion for defects	Classification of defects
⑴Open segment and open common	Any segment or common patterns that does not activate when they should are rejected.	Major
⑵Short	. No shorts are allowed. . Segment-to-segment shorts are when two or more segment electrodes are bridged together; they cause the shorted segment to activate together when they should not. (They may not be as dark as other segments) . Segment-to-common shorts are caused by some conductive foreign materials in the fluid bridging between a segment and back plane electrodes.	Major
⑶High current	The total current required to activate all segments shall not exceed the limit specified in the specification for approval for the tested voltage.	Major
⑷Weak segment(Dim segment)	Segments that only partially activate are rejected; they are not as dark as other segments.	Major
⑸Display Pattern	⑴Dot type	Minor
	Unit: mm (A+B)/2≤0.25 C≥0 (D+E)/2≤0.25 (F+G)/2≤0.25 Note: 1) Acceptable up to 3 damages. 2) If there're two or more pinholes per digit, it is rejected.
	2) Segment type:
	Unit: mm c≤w/4 d≤w/4 Note: 1) Acceptable up to 3 damages. 2) If there're two or more pinholes per digit, it is rejected.
	Size D (mm) Acceptable number D=(a+b)/2 A zone D﹤0.15 Ignore 0.15≤D﹤0.25 2 0.18﹤D﹤0.25 1 0.25≤D 0
⑹Blemishes or Foreign MattersSize: D=(A+B)/2	Size D (mm) Acceptable number A zone B zone D≤0.15 Ignore Ignore 0.15﹤D≤0.20 2 Ignore 0.2﹤D≤0.25 1 - 0.2﹤D≤0.3 - 2 0.25﹤D≤0.3 0 1 0.5﹤D 0 0
⑺Dark lines and scratches	Width (mm) Length(mm) Acceptable number A zone B zone W≤0.03 L≤3.0 3 Ignore 0.03<W≤0.05 L≤2.0 2 3 0.05<W≤0.08 L≤2.0 1 2 0.08<W≤0.1 L≤3.0 0 1 0.1<W L>3.0 0 0	Minor
⑻Air bubble in polarizer	Size D (mm) Acceptable number A zone B zone D≤0.20 Ignore Ignore 0.20﹤D≤0.40 3 Ignore 0.40﹤D≤0.60 2 Ignore 0.2﹤D≤0.3 0 0	Minor
⑼ Dirt	Products pass if the dirt can be wiped off easily
⑽Chip in corner		Minor
	a b c Acceptable number a﹤4mm b≤W C≤T 3
⑾Chip in seal area		Minor
	a b c Acceptable number a﹤3mm b≤1.5mm c≤1/2T 3
	Chip is rejected, if c is greater than 50% of the glass thickness or the seal area is damaged.
⑿Chip in pad(1)		Minor
	a b c Acceptable number a≤2mm b≤W/4 c≤T ignore a≤3mm b≤W/4 c≤T 3
⒀Chip in pad(2)		Minor
	a b c Acceptable number a≤2mm b≤W/3 c≤T ignore a≤4mm b≤W/2 c≤T 3
⒁Chip in other sides		Minor
	a b c Acceptable number a≤3mm b≤1mm c≤T ignore a≤4mm b≤1.5mm c≤T 3
⒂Glass rest		Minor
	a≤1/4W

Reliability

2.1 Items of reliability
All test result items should be judged after 4 hours recovery time at room temperature and under the state of not operating.

Note: No cosmetic failure means there must be no permanent cosmetic defect and does not include any recoverable defect after 24 hours or more.